TRANSMISSION ELECTRON MICROSCOPE (TEM)
FEI TECNAI SPIRIT G2 with ICORR
FEI’s iCorr™ technology consists of a fluorescence light microscope module and unique software that researchers use to conduct fast and accurate correlative microscopy experiments with transmission electron microscopy (TEM). Researchers quickly pinpoint structures of interest on their sample using the fluorescence light microscopy mode and then navigate easily to these features in TEM mode. Then, they are able to automatically capture high resolution image data on the stored structures using the electron microscopy mode.
iCorr’s powerful software automatically correlates the results. This combination of technology and automation streamlines experiments, allowing users to quickly capture data from two modalities without ever changing instruments. This integrated approach removes the challenges with conducting correlative microscopy experiments and opens up new dimensions for biological research.
JEOL JEM-1010 TEM & JEOL JEM-1220 TEM
The JEM-1010 TEM and JEM-1220 TEM operates at 100kV with a tungsten electron source. It is a compact high performance TEM with advanced features and functions. The high contrast objective lens polepiece combines the highest possible contrast and brightness with optimum resolution for life science studies. The JEOL cool beam gun allows high-brightness, high coherence illumination conditions with low emission current. They have user-friendly controls that are suitable for beginners in TEM imaging.
SCANNING ELECTRON MICROSCOPES (SEM)
FEI QUANTA 650 FEG SEM
The FEI Quanta 650 FEG SEM allows characterization of conductive and non-conductive samples with SE and BSE imaging possible in every mode of operation. It minimizes the amount of sample preparation, and the low vacuum capability enables charge-free imaging of non-conductive specimens thanks to Quanta’s patented through-the-lens pumping.
Surface imaging with optional beam deceleration mode is possible to obtain surface and compositional information from conductive samples. Easy to use and intuitive controls makes highly effective operation possible for novice users.
JEOL JSM-6701F FEG SEM
The JSM-6701F with the high resolution semi in-lens enables one to observe delicate specimens with minimum damage at very low accelerating voltages. At lower voltages, the fine surface structures can be observed more clearly than at higher voltages. Non-conductive specimens can be observed without a conductive coating on the specimens.
ATOMIC FORCE MICROSCOPES (AFM)
BRUKER BIOSCOPE CATALYST AFM with OLYMPUS IX81 LIGHT MICROSCOPE
BioScope Catalyst has the largest XY scan range (150um), the largest standard Z range (>20um) available, superior optical access from both above and below, and open physical access to the sample. The BioScope Catalyst is also designed specifically for safety and reliability when working with biological samples. The head and baseplate direct fluid vapor and liquids that might escape critical components. The piezo crystals used for XY and Z scanning are sealed and inaccessible to fluid. New, more robust probe holder designs keep liquids where they should be.
The BioScope Catalyst works with a wide range of sample types, including coverslips, glass slides, 35 and 60mm plastic petri dishes, and 50mm glass-bottom petri dishes, which are conveniently held with magnetic clamps. Any of these may be used with the included sample heater for imaging at up to 40°C. The included micro-volume perfusion cell can be used along with almost any sample substrate to form a closed volume of about 60uL, through which fluid can be perfused with a syringe through microbore tubing. It’s ideal for use when expensive or scarce drugs, proteins, or other compounds are to be used.
SAMPLE PREPARATION FOR MICROSCOPY
REICHERT ULTRACUT E
LEICA ULTRACUT UCT
LEICA EM FCS CRYO-ULTRACUT
LEICA EM UC6
Automated immunogold labelling system
LEICA EM IGL
Critical point dryers and sputter coaters
LEICA EM CPD300
LEICA EM ACE200